Overview:Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science 494 - This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

This book is on page /88f0ff300130a9332bf7ee8997e69000/book/1603729775-9780412145612. It was written by the following authors: Lawrence C. Wagner. Book Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science 494, which can be read online, published by the company: Chapman and Hall. Other books on similar topics can be found in sections: Technology, Medicine, Science. The book was published on 1999-01-31 00:00:00. It has 255 pages and is published in Hardback format and weight 1250 g. File for download Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science 494 has PDF format and is called failure-analysis-of-integrated-circuits-tools-and-techniques-the-springer-international-series-in-engineering-and-computer-science-494.pdf. Other books you can download below. Our nottedeiricercatoriaq.it site is not responsible for the content of PDF files.


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