Overview:Failure Mechanisms in Semiconductor Devices - Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devices, semiconductor technology has become increasingly important. The high complexity of today's integrated circuits has engendered a demand for greater component reliability. Reflecting the need for guaranteed performance in consumer applications, this thoroughly updated edition includes more detailed material on reliability modelling and prediction. The book analyses the main failure mechanisms in terms of cause, effects and prevention and explains the mathematics behind reliability analysis. The authors detail methodologies for the identification of failures and describe the approaches for building reliability into semiconductor devices. Their thorough yet accessible text covers the physics of failure mechanisms from the semiconductor die itself to the packaging and interconnections. Incorporating recent advances, this comprehensive survey of semiconductor reliability will be an asset to both engineers and graduate students in the field.
This book is on page /88f0ff300130a9332bf7ee8997e69000/book/1603729738-9780471954828. It was written by the following authors: E. Ajith Amerasekera, Farid N. Najm. Book Failure Mechanisms in Semiconductor Devices, which can be read online, published by the company: John Wiley & Sons Inc. Other books on similar topics can be found in sections: Technology, Medicine, Science. The book was published on 1997-06-20 00:00:00. It has 358 pages and is published in Hardback format and weight 674 g. File for download Failure Mechanisms in Semiconductor Devices has PDF format and is called failure-mechanisms-in-semiconductor-devices.pdf. Other books you can download below. Our nottedeiricercatoriaq.it site is not responsible for the content of PDF files.
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